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Thin Solid Films 1999: Vol 348 Table of Contents PDF

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e Z. Gong,E .G.W ang,G .C.X u,Y . Chen. Influence of deposition condition and hydrogen on amorphous-to-polycrystalline SiCN films ea ees ere e ee oe ee ere Oar era he kre een ari ee eo ee ey) ee pe T. Tharigen, G. Lippold, V. Riede, M. Lorenz, K.J. Koivusaari, D. Lorenz, S. Mosch, P. Grau, R. Hesse, P. Streubel, R. Hard amorphous CSi,N, thin films deposited by rf nitrogen plasma assisted pulsed laser ablation of mixed graphite/Si,N,-targets Se ee es A SS EE oss 4 4 Ho 6 0 0k bt 0 6 8 OS Cee oO OE OEE de ES FUER Oe ee od Preparoafta ilounm fiinlamf sr oam n ews ol-rgoeult e eras GE, Ce A, 6k 6-85 WNe a Wik he ake ORK ARE EO SON OEE SERENE ESSE SOOO OO ZrO,f ilm growthb y chemicalv apord epositiouns ingz irconiutme tra-fert-butoxide Tene Sac NE 5 88 he 5D BREA Oe SPECS O02 b de TEER EY 48 EA OS ROE RAH EER OD OE The contributioonf H’ ion etchingd uringt he initiald epositions tage to the orientationg rade of diamondf ilms > Comte, Ge: Gp Came, Fi. CORRRG, F. PU no 56 0 8 CR OR C4 6h AKO HERE OKLE Kage see Experimenteavli dencoef boroni nducecdh argedde fectsin amorphoussil iconm aterials Fi, Fa, Tee es, ©c S Bs WOES. bide rtd + $0 ee ee OE OE Ol 6 8 8 eee Or Effects of hydrogen partial pressure on the structure and properties of sputtered silicon layers a I, Ge 0 ty es PE Es I ok kok a 0S 0 eS he Oe ewe 08 8 oe oO Ce Oe Ambient-dried SiO, aerogel thin films and their dielectric application Te ne eee er a a ee er re eee ee ee ee ee flea Seep KrF laser CVD of titanium oxide from titanium tetraisopropoxide Ame © Be Bo eee eee ee ee ee ee eee re re ee ag re ee ee Structural and electrical properties of r.f.-sputtered RuO, films having different conditions of preparation N. Romeo, S. Cozzi, R. Tedeschi, A. Bosio, V. Canevari, M.A. Tagliente, M. Penza...............0020005 HqZtfgbqfedhoiueulirynirlavaego Sn mlischw s:icit ntMeSiO,/Si and Si on evaporated flash films thin BaTiO; in trapping and transport Charge r- ysnor lh ueFc es eee ERS Un ie 6 dA Oe ee ew ee eh es Pee See er eee ee moitnaexsubstLraoaAntl eQsgO r,o fwilnm sS roTfi O;p ropertimeisoc nr olsatyreruL catAulraOl; hoomfo -Eefpfiecttasx ial syc eeeee en eh Eo EEA A Ee CSE Le PORE oORr2 4 4 20.4 EE I es Pe Se t surfacesP t(o1f1 1) modificatcihoenbm yic alf ilmsC o ordoefr ed grotwhteho f Control eee ie: eA aeee eba eae ek weedo e oncea k 5a Gk MII,N I SOOm , PrIs ES GDS, as characterimzaettmoi born anea pplied technoitqhueearsn d method penegtaars a tbiyon measurePmoernostist y eles yee eeee ee ee Oe ENO KR RR BREad bn 5 es ee seei copper power vcwmdoPeoieefernttv rtthaiifa lccocleartisl-mz laaetnviceoeln eeesneese eee eee cee 00. NOKYG.Y OMIB. Ogaw5.a , OkamA.o to, YosmMt.e ke, NosaTk.a , Copper nitride thin films prepared by reactive radio-frequency magnetron sputtering aloe gr Me ...............220008. Karlsson... U.O. Gothelid, M. Chiaia, G. Hirschauer, B. Studies of highly oriented CeO, films grown on Si(111) by pulsed laser deposition SaCynhndatTee eer Serree ee e eeeee ee a ee a ee a ER bes EE Pe rhaectchips semoifc ondsiudcet or bottfoorm film Solderabltiecrsi Letter zation Contents 1999 Jul6y 348, Volume ER EVIL SE 103 99 90 84 79 74 69 63 56 49 eT8eCCCCeCT4e OTeer4S ee Ce e C38 T30 T22 14 8 , t , t e ge e d Hiro. T. film/LABu Al/opfo lyimides tructufrreo m released energy Electrical ee ee eeae eee eeeo eee re ei ee a ester dihexadecyl biloifr ubin films Langmuainrd— Blodgett Monolayer aes Rk we ek Ok dune SRE a8 ew ee er ee eh OGae ke a ee Ae a e films Langmuir—Blodgett poloyf( N-polyfluproorpoearltkiyesl acFrriycltaimoniadle s) Films Relataend d Biological Langmuir-Blo Teeee s wees KoMp. cewWirJ.oc nza.,. ..C.z.Ma..p .ki eGwiibcbszM,,. R.J. StTo.b ieckiC,a sFt.Ja.n o, structurest rilayer Zr/iFne /Zr layeFres ultroaft hin properties morphaonld ogical Magnetic Magneatnod- optics Magnetics ee eee es ee) eee ee eee ............004. Berg... S. Katardjiev, I.V. Hedlund, C. Jonsson, L.B. topography surface pronounced with substrates on layers barrier Ti/W deposited sputter of variations Compositional C. Kylner, L. Mattsson......... Ua ee eae a ook ea Dee AR Be Ale ee Ok oe koe ee Teeter ee ee inclusionc oppbeyr films aluomfi nium performoapntciec al Enhanced OOEapplntteM. PoulinguM. Ignat, J. Dijon. .... ee ie eee ee ee ee eee ee we were a a ere fs Sanee ees dico t-cresThe effects of particle pollution on the mechanical behaviour of multilayered systems ol neicctsr,oMechanics and Nanomechanics of Thin Layers icscaateeeeeeSeewRBR¥FB ss .eraeaayB ra-eh ys eemee 8.vde m.,,.eeea . pp wooppbp.tnammcofEosoasrrlrysiiifn.diiffhnei oaet llf dtc dect p srpimeiar mhieic mcatnoiadorotariisecnnnt -eou t a yianmcdmrtIolotcboPTl c osu uhnhnaoffe iVaaslLayers Hard and Protective Metallurgical,e cfimr hNtlitD tlcerai /siuuk lovnltCenrlsigaenreeaiosydcs eoN ue es nT. Sass, I. Pietzonka, V. Gottschalch,G. Wagner ......... SpA Wh USN a Bia te acl Sk eel w AS Ae aR Oe OS rr edmorphology antiphase (Galn)P between the surface Correlation and boundaries ordered in F.C. Meldrum, J. Flath, W. Knoll. ...... mld avha tie bon ae Vee e eee Tee ae eee ee eT we eee eee ee Formation of patterned PbS and ZnS films on self-assembled monolayers S. Kochowski, K. Nitsch, R. Paszkiewicz.... . ee oe nl ee ie ire ee a pene’ oa ae ais ob Electricaplr opertieosf SiO,—(nG) aAs interfacoen the basiso f measuremenotfs M IS structurcea pacitancaen d conductance I. Zawieza, R. Bilewicez, E. Luboch, J.F. Biermat. ... 0 cc ec tc cc I re ree eae ile vay ahs Properties of Z and E isomers of azocrown ethers in monolayer assemblies at the air—water interface Surfaces, Interfaces and Colloidal Behaviour E.BaMGc.B.h aS Ba.uAre dimnM,J,o . a r.c,q. ua.eri.titea.2h.ren a e. 6 rae.kg . taDo kaie dg Structural and optical properties of sputtered ZnO films 4 ee erra eee eee e ee ee ae eee Se a ere Oe are A me ae eea E Conduction of metal—isolator-semiconductor structures with granular silicon thin films VE2 nRsc IeaO O eaeeee a eeee Se eeyeeeee eoE Seee ee J.DM. orenMo.,L M.a rcoFs.A ,g ullo-RRu.Ge udear,r ero-RL.JeM.m aurst,i n-PJa.lMMm. aar,t inez-JD.G uoanrzta,l ez-A galvanostatic study of the electrodeposition of polypyrrole into porous silicon H. Takikawa, T. Matsui, T. Sakakibara, A. Bendavid, P.J. Martin ........ SO ae eC ar tl Pe) eye, ae ae Properties of titanium oxide film prepared by reactive cathodic vacuum are deposition V.I. Levchenko, L.I. Postnova, V.P. Bondarenko, N.N. Vorozov, V.A. Yakovtseva, L.N. Dolgyi...... SK ae ee Heteroepitaxoyf PbS on porous silicon ee eS ES ee Te eee Te eee eT eR Te eee ee ee een er Electrochromism of anodic oxide film on TiN coating in aqueous and non-aqueous electrolytes oe? 8 ee ee ee A eaeee pe deed a elaaeke Sco bk we The effect of additives on the viscosity of dimethylaluminum hydride and FTIR diagnostics of the gas-phase reaction B. Chandar Shekar, V. Veeravazhuthi, S. Sakthivel, D. Mangalaraj, S.K. Narayandass.............. Teer Growth, structure, dielectric and AC conduction properties of solution grown PVA films vi Contents 2 8 3 7 2 5 4 3 3 2 2 1 210 2 2 2 2 2 2 eehOAo2aARketeOOe bh ewa0AewSe A e2 ,e 196 e188 180 173 165 157 145 14] 134 130 122 R n o i t A leaflet describing our requirements is available from the Publisher upon request. The publisher encourages the submission of articles in electronic form thus saving time and avoiding rekeying http://www.elsevier.nl/locate/tsf For more information on Thin Solid Films, please visit our website at: Subject Index of Volume 348 0... ee ee ees eee ee ee Te PE eT ee ee ee Pe eee ee Ses A IE IE 56a in a 6 We ee ee a ae Oe Ee RS Oe ee eee el N. Kovtyukhova, P.J. Ollivier, S. Chzhik, A. Dubravin, E. Buzaneva, A. Gorchinskiy, Marchenko, N. Smirnova... . . Erratum to ‘‘Self-assembly of ultrathin composite TiO,/polymer films”’ Erratum a ee eee ee er se eee eee er ee eee ee A comparative study of SnO, and SnQO),:Cu thin films for gas sensor applications eee es Ok I MU EE 6 0 6% ooo aie de Wee we Oe BRS ES Oe oe ee ee Properties of reactively sputtered WN, as Cu diffusion barrier Pee POT UE eT CCU CORO C ET CURE CC ee ParpneorBtdpfofighaa pil,sitrrletoTun maorbeiw stws;m itnOper ,esa,rt aet ures aio eae ee ae ace ee we ace a aine ia .. StoopP...M.. TonsinDg.,L . Merwdee,r van J.H. Cud oubllaey oenrM o(11P0h)a:st rea nsition eS Oe SiEeO& e OY EAR heea kee peleke ka ee SE Ee AA ee A EiL Opticalproperties of film—substrate systems with an anisotropic, spatially varying dielectric function of the surface layer Condensed Film Matter Behaviour eeueen es eee eee eee eee 6 we ZOMBMTiO.O ON.. LakEa.t os, VonVc.a , Siotca,-T .A, eeeeceT,a r. sgorlo-wgenl sotCIinuoTl blOielc ooind al films we Oks eee eee earee ee eee ce nk TIT. eVei. : GSeE. , ee,2 . See¥,, elpaiytearxsi al NO); based tosIhneni nPns or eee e e12..2... . eKulka rniS...K.. LoboA,. Rao, V.J. ManorSa.Vm.a , Reddy, C.V.G. modebla sedf uncwtaoi robkny explaiBnaoeSfdn O;,s engsaiostf i vity modulaadtdiimtoeintv eaN l oble as atesae die ew RRW e Wels haieeaecre e-' nce Sek Sg ale hUe g NUeae : aass : Pto/nM gfOi lmtsh in ferroelectr(iPcb ,Csao)lT—igOe;lo rientce-dA xis Actuaatnodr s Sensors DeviceFs,i lm Thin Contents er r o rs. 3 3 3 3 2 294 285 279 273 266 261 253 1 1 1 0 9 6 4 2 4 9

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