RFIC Design and Testing for Wireless CCoommmmuunniiccaattiioonnss A Full-Day Tutorial at VLSI Design & Test Symposium July 23, 2008 Lecture 1: Introduction VViisshhwaannii DD. AAggrraawaall, vaaggrraawaall@@eenngg.aaubburrnn.eeddu Foster Dai, [email protected] Auburn University, Dept. of ECE, Auburn, AL 36849, USA 1 Abstract This tutorial discusses design and testing of RF integrated circuits ((RRFFIICC)). IItt iiss ssuuiittaabbllee ffoorr eennggiinneeeerrss wwhhoo ppllaann wwoorrkk oonn RRFFIICC bbuutt ddiidd nnoott have training in that area, those who work on IC design and wish to sharpen their understanding of modern RFIC design and test methods, and engineering managers. It is an abbreviated version of a one- semestter uniiversiitty course. SSpeciiffiic ttopiics iinclludde semiicondducttor technologies for RF circuits used in a wireless communications system; basic characteristics of RF devices – linearity, noise figure, gain; RF front-end desiggn – LNA,, mixer;; freqquencyy syynthesizer desiggn – pphase locked loop (PLL), voltage controlled oscillator (VCO); concepts of analog, mixed signal and RF testing and built-in self-test; distortion – theory, measurements, test; noise – theory, measurements, test; RFIC SSOOCCss aanndd tthheeiirr tteessttiinngg. 2 Objectives (cid:137) To acquire introductory knowledge about integrated circuits (IC) used in radio frequency (RF) communications systems. (cid:137) To learn basic concept of design of RFIC. (cid:137)(cid:137) TToo lleeaarrnn bbaassiicc ccoonncceeppttss ooff RRFFIICC tteessttiinngg.. 3 Outline (cid:137) Introduction to VLSI devices used in RF communications ■ SOC and SIP ■ Functional components ■ Technologies (cid:137) Design concepts (cid:137) Test concepts ■ Basic RF measurements ■ Distortion characteristics ■ Noise ■ SOC testing and built-in self-test (BIST) 4 References 1. M. L. Bushnell and V. D. Agrawal, Essentials of Electronic Testing for Digital, Memory & Mixed-Signal VLSI Circuits, Boston: Springer, 2000. 2. J. Kelly and M. Engelhardt, Advanced Production Testing of RF, SoC, and SiP Devices, Boston: Artech House, 2007. 33. BB. RRaazzaavvii, RRFF MMiiccrrooeelleeccttrroonniiccss, UUppppeerr SSaaddddllee RRiivveerr, NNeeww JJeerrsseeyy:: PPrreennttiiccee Hall PTR, 1998. 4. J. Roggers,, C. Plett and F. Dai,, Integgrated Circuit Desiggn for Higgh-Sppeed Frequency Synthesis, Boston: Artech House, 2006. 5. K. B. Schaub and J. Kelly, Production Testing of RF and System-on-a-chip Devices for Wireless Communications, Boston: Artech House, 2004. 5 Schedule 09:30AM – 10:00AM Lecture 1 Introduction Agrawal 10:00AM – 11:00AM Lecture 2 RF Desiggn I Dai 11:00AM – 11:30AM Break 1111::3300AAMM – 1133::0000PPMM LLeeccttuurree 33 RRFF DDeessiiggnn IIII DDaaii 13:00PM – 14:00PM Lunch 14:00PM – 15:00PM Lectures 4 RF Testing I Agrawal 15:00PM – 15:30PM Break 15:30PM – 17:30PM Lectures 5-7 RF Testing II Agrawal LLeeccttuurree 88 RRFF BBIISSTT DDaaii 6 An RF Communications System Superheterodyne Transceiver ADC 00° ) P LNA VGA Phase LO S Splitter D ( 90° r o ss rr e s x ADC e e c LO l o p r u P D l DDAACC aa n g 0° i S PA VGA Phase LO al t Splitter i g ii 90° D DAC RF IF BASEBAND 7 An Alternative RF Communications System Zero-IF (ZIF) Transceiver ADC 00° ) P LNA Phase LO S Splitter D ( 90° r o rr ss e s x ADC e e c l o p r u P D l DDAACC aa n g 0° i S l Phase LO a PA t Splitter i g i 90° D DAC RF BASEBAND 8 Components of an RF System (cid:137)Radio frequency (cid:137)Mixed-signal ● Duplexer ● ADC: Analog to digital ● LNA: Low noise amplifier converter ● PA: Power amplifier ● DAC: Digital to analog converter ● RRFF mmiixxeerr ● Local oscillator (cid:137)Digital ● Filter ● Diggital siggnal pprocessor (cid:137)Intermediate frequency (DSP) ● VGA: Variable gain amplifier ● MModdullattor ● Demodulator ● Filter 9 Duplexer (cid:137)TDD: Time-Division (cid:137)FDD: Frequency- DDuupplleexxiinngg DDiivviissiioonn DDuupplleexxiinngg ● Same Tx and Rx frequency ● Tx to Rx coupling (-50dB) ● RF switch (PIN or GaAs FET) ● More loss (3dB) than TDD ● LLess tthhan 11ddBB lloss ● AAddjjacentt chhannell lleakkage fr RRxx Rx ft fr Tx Tx TDD command ft 10