इंटरनेट मानक Disclosure to Promote the Right To Information Whereas the Parliament of India has set out to provide a practical regime of right to information for citizens to secure access to information under the control of public authorities, in order to promote transparency and accountability in the working of every public authority, and whereas the attached publication of the Bureau of Indian Standards is of particular interest to the public, particularly disadvantaged communities and those engaged in the pursuit of education and knowledge, the attached public safety standard is made available to promote the timely dissemination of this information in an accurate manner to the public. “जान1 का अ+धकार, जी1 का अ+धकार” “प0रा1 को छोड न’ 5 तरफ” Mazdoor Kisan Shakti Sangathan Jawaharlal Nehru “The Right to Information, The Right to Live” “Step Out From the Old to the New” IS/QC 400401 (1994): Fixed Resistors for Use in Electronic Equipment - Blank Detail Specification - Fixed Resistor Networks with Individually Measurable Resistors, all of Equal Value and Equal Dissipation - Assessment Level E [LITD 5: Semiconductor and Other Electronic Components and Devices] “!ान $ एक न’ भारत का +नम-ण” Satyanarayan Gangaram Pitroda ““IInnvveenntt aa NNeeww IInnddiiaa UUssiinngg KKnnoowwlleeddggee”” “!ान एक ऐसा खजाना > जो कभी च0राया नहB जा सकता हहहहै””ै” Bhartṛhari—Nītiśatakam “Knowledge is such a treasure which cannot be stolen” IS QC 400401: 1994 IEC QC 400401: 1983 Indian Standard FIXED RESISTORSFOR USEINELECTRONIC EQUIPMENT- BLANKDETAIL SPECIFICATION- FIXED RESISTOR NETWORKSWITHINDIVIDUALLY MEASURABLERESISTORS,ALLOFEQUAL VALUEANDEQUALDISSIPATION- ASSESSMENTLEVELE NATIONAL FOREWORD This Indian Standard, which is identical with 1EC Pub 115-6-l/ QC 400401 ( 1983 ) ‘Fixed resistors for use in electronic equipment - Part 6 : Blank detail specification for fixed resistor networks with individually measurable resistors, all of equal value and equal dissipation - Assessment level E’, issued by the International Electrotechnical Commission, WdS adopted by the Bureau of Indian Standards on the recommendation of the Resistors Sectional Committee ( LTD 14 ) and approval of the Electronics and Telecommunication Division Council. The text of the IEC standard has been approved as suitable for publication as Indian Standard without deviations. Certain conventions are, however, not identical to those used in Indian Standards. Attention is particularly drawn to the following: a) Wherever the words ‘International Standard’ appear, referring to this standard, they shbuld be read as ‘Indian Standard’. b) Comma ( , ) has been used as a decimal marker while in Indian Standards, the current practice is to use a point ( . ) as the decimal marker. In this adopted standard, reference appears to certain International Standards for which Indian Standards also exist. The corresponding lndian Standards which are to be substituted in their place are listed below along with their degree of equivalence for the editions indicated: International Sfandard Corresponding Indian Standards Degree of Equivalence IEC Pub 115l/QC 400000 ( 1982 ) IS QC 400000 Fixed resistors for use in Identical Fixed resistors for use in elec- electronic equipment - Generic tronic equipment, Part 1 : specification Generic specification IEC Pub 115-6/QC 400400 Fixed IS QC 400400 Fixed resistors for use in Identical resistors for use in electronic electronic equipment - Sectional equipment - Part 6 : Sectional specification - Fixed resistors net- specification : Fixed resistors works with individually measurable networks with individually resistors measurable resistor The concerned technical committee has reviewed the provisions of IEC 63 ( 1963 > and 1EC 410 ( 1973 ), referred in this adopted standard and has decided that they are acceptable for use in conjunction with this standard. This standard is intended primarily for use under the IECQ System. A regular Indian Standard for this component could be different, identical or similar to this standard. Only the English language text in rhc International Standard has been retained while adopting it in this Indian Standard. As in the Original Standard, this Page is Intentionally Left Blank L _ _ ._ *.__ --_. IS QC 400401 : 1994 IEC QC 400401 : 1983 Blank detail specification A blank detail specification is a supplementary document to the Sectional Specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements shall not be considered as being in accord- ance with I E C specifications nor shall they so be described. In the preparation of detail specifications the content of Sub-clause 1.4 of the Sectional Specification shall be taken into account. The numbers between brackets on the first page correspond to the following information which shall be inserted in the position indicated. Identification of the detail specification ]l[ The “International Electrotechnical Commission” or the National Standards Organization under whose authority the detail specification is drafted. [2] The I E C or National Standards number of the detail specification, date of issue and any further information required by the national system. [3] The number and issue number of the I E C or national Generic Specification. [4] The I E C number of the blank detail specification. Identification of the resistor network PI A short description of the type of resistor network. PI Electrical circuit showing all resistors and connections contained in the network. Terminal pin numbers shall be shown. Alternatively, this drawing may be given in an appendix to the detail specification. [71 Information on typical construction (when applicable). Note. - When the resistor network is not designed for use in printed board applications, this shall be clearly stated in the detail specification in this position. PI Outline drawing with main dimensions which are of importance for interchangeability and/or reference to the national or international documents for outlines. Alternatively, this drawing may be given in an appendix to the detail specification. [91 Application or group of applications covered and/or assessment level. Note. - The assessment level(s) to be used in a detail specification shall be selected from the sectional specification, Sub-clause 3.3.3. This implies that one blank detail specification may be used in combination with several assessment levels, provided the grouping of the tests does not change. [IO] Reference data on the most important properties, to allow comparison between the various resistor network types. 3 IS QC 400401 : 1994 IEC QC 400401 : 1983 PI I E C I15-6-1-XxX PI ELECTRONIC COMPONENTS OF ASSESSED IEC 115-6-I (41 QUALITY IN ACCORDANCE WITH: 131 FIXED RESISTOR NETWORKS WITH INDIVIDUALLY MEASURABLE RESISTORS, Outline drawing: (see Table 1) ALLOFEQUALVALUE ( . angle projection) AND EQUAL DISSIPATION 151 PI [61 Insulated/non-insulated 171 Assessment level(s): E 191 (Other shapes are permitted within the dimensions given) Stability c!ass:-. %. Information on the availability of components qualified to this detail specification is given in the Qualified Products List. . 4 IS QC 400401 I 1994 IEC QC 400401 : 1983 SECTION ONE - GENERAL DATA General data .l Recommended method(s) of mounting (to be inserted) (See Sub-clause 1.4.2 of I E C Publication I 15-6.) .2 Dimensions, ratings and characteristics TABLE I I Dimensions Isolation Rated Rated Limiting voltage element network element between Style dissipation dissipation voltage elements (if at 70 “C at 70°C (V d.c. or applicable) (W) (W a.c. r.m.s.) (V) All dimensions are in millimetres or inches and millimetres. Resistance range * . * . ot . . . Tolerances on rated resistance .% Climatic category -l-iF * . Low air pressure 8.5 kPa (85 mbar) Stability class . . . % Limits for change of resistance: - for long-term tests &(. * .%R+ . ..n) - for short-term tests &(. . .%R + . . . )2f Temperature coefficient a: . . . 10_6/“C 1.2.1 Derating Resistors covered by this specification are derated according to the following curve: (A suitabk curve to he included in the. detail specifiattion) Note. - See also Sub-clause 2.2.3 of the sectional specification. + The preferred values are those of the E-series of I E C Publication 63: Preferred Number Series for Resistors and Capacitors. IS QC 400401 : 1994, IEC QC 400401 : 1983 1.3 Related documents Generic Specification : I E C Publication 115-l (1982): Fixed Resistors for Use in Electronic Equipment, Part 1: Generic Specification. Sectional Specification : I E C Publication 115-6 (1983) : Part 6 : Sectional Specification : Fixed Resistor Networks with Individually Measurable Re- sistors. 4.1 Marking The marking of the components and packing shall be in accordance with the requirements of I E C Publication 115-6, Sub-clause 1.5. Note. -- The details of the marking of the component and packing shall p given in full in the detail specifi- cation. 1.5 Ordering itzformation Orders for resistor networks covered by this specification shall contain, in clear or in coded form, the following minimum information : a) Rated element resistance. 6) Tolerance on rated resistance. c) Number and issue number reference of the detail specification and style reference. 1.6 Certified records of released lots Required/not required. 1.7 Additional information (not for inspection purposes) 1.8 Additional or increased severities or requirements to those specified in the generic and/or sectional specification Note. - Additions or increased requirements should be specified only when essential. SECTION TWO -- INSPECTION REQUIREMENTS 2. Inspection requirements 2.1 Procedures 2.1 .l - For Qualification Approval the procedure shall be in accordance with the Sectional Specification, I E C Publication 115-6, Sub-clause 3.2. 2.1.2 - For Quality Conformance Inspection, the test schedule (Table II) includes sampling, periodicity,‘severities and requirements. The formation of inspection lots is covered by Sub-clause 3.3.1 of the Sectional Specification. Nore. - When drying is called for, Procedure I of Sub-clause 4.3 of the Generic Specification, I E C Publication 115-1, shall be used. 6