इंटरनेट मानक Disclosure to Promote the Right To Information Whereas the Parliament of India has set out to provide a practical regime of right to information for citizens to secure access to information under the control of public authorities, in order to promote transparency and accountability in the working of every public authority, and whereas the attached publication of the Bureau of Indian Standards is of particular interest to the public, particularly disadvantaged communities and those engaged in the pursuit of education and knowledge, the attached public safety standard is made available to promote the timely dissemination of this information in an accurate manner to the public. “जान1 का अ+धकार, जी1 का अ+धकार” “प0रा1 को छोड न’ 5 तरफ” Mazdoor Kisan Shakti Sangathan Jawaharlal Nehru “The Right to Information, The Right to Live” “Step Out From the Old to the New” IS 14700-4-11 (2008): Electromagnetic compatibility (EMC) : Part 4 Testing and measurement techniques, Section 11: Voltage dips, short interruptions and voltage variations immunity tests [LITD 9: Electromagnetic Compatibility] “!ान $ एक न’ भारत का +नम-ण” Satyanarayan Gangaram Pitroda ““IInnvveenntt aa NNeeww IInnddiiaa UUssiinngg KKnnoowwlleeddggee”” “!ान एक ऐसा खजाना > जो कभी च0राया नहB जा सकता हहहहै””ै” Bhartṛhari—Nītiśatakam “Knowledge is such a treasure which cannot be stolen” IS14700 (Part41Sec 11): 2008 lEe 61000-4-11 : 2004 'J.fNrfl4 J.flrtCh ~ ~ ~iJlddl (~ ~ fft) 1fTJT 4 tJ&vT 3tnlfTtFf('f(fi;ftcfi ~ ~~. ~ ~ ~ ~~~(fl~ ~ ~ 11 C2TcItlR Indian Standard ELECTROMAGNETIC COMPATIBILITY (EMC) PART 4 TESTING AND MEASUREMENT TECHNIQUES Section 11 Voltage Dips, ShortInterruptionsand Voltage Variations ImmunityTests ICS 33.100.20 «':>BIS2008 BUREAU OF INDIAN STANDARDS MANAK BHAVAN. 9 BAHADUR SHAH ZAFAR MARG NEW DE LHI 110002 April2008 PriceGroupt Electromagnetic CompatibilitySectional Committee,LITO09 NATIONAL FOREWORD This Indian Standard (Part 4/Sec 11) which is identical with IEC 61000-4-11 : 2004 'Electromagnetic compatibility (EMG) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests' issued by the International Electrotechnical Commission (lEG) was adopted by the Bureau of Indian Standards on the recommendation of the Electromagnetic Compatibility Sectional Committee and approval of the Electronics and InfoRnation Technology DivisionCouncil. Thetextof lEGStandard hasbeen approved as suitable for publication asar-Indian Standardwithout deviations. Certain conventions are, however, not identical to those used in Indian Standards. Attentionisparticularly drawn to the following: a) Wherever the words 'InternationalStandard' appear referringto thisstandard, theyshould bereadas 'Indian Standard'. b) Comma (,) has been used as a decimal marker, while in Indian Standards, the current practice isto useapoint (.)asthedecimalmarker. The technical committee responsible for thepreparationof this standard has reviewed the provisions of the following International Standard referred in this adopted standard and has decided that it is acceptableforuseinconjunction withthisstandard: InternationalStandard Title IEC61000-2-8 Electromagnetic compatibility (EMC) - Part 2·8: Environment - Voltage dips and short interruptions on public electric power supply systems with statistical measurementresults Only the English text of the Intemational Standard has been retained while adopting it as an Indian Standard.andassuchlhe page numbersgivenherearenotthesame asinthe IEC Publication. IS14700(Part 4ISec 11):2008 lEe 61~11:2004 Indian Standard ELECTROMAGNETIC COMPATIBILITY (EMC) PART4 TESTING AND MEASUREMENTTECHNIQUES section 11 Voltage Dips, ShortInterruptionsand VoltageVartationaImmunityTeats 1 Scope This part of IEC 61000 defines the rmmurnty test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips,short interruptions,and voltage vanations. This standard applies to electrical and electronic equipment having a rated mput current not exceeding 16A per phase,for connection to 50 Hz or60 Hz ac networks It does not apply to electrical and electronic equipment for connection to 400 Hz a.c networks Tests for these networksWillbe covered byfuture IECstandards The object of this standard is to establish a common reference for evaluating the Immunity of electrical and electronic equipment when subjected to Voltage dips. short Interruptions and voltage variations. NOTE Volt.gefluctu.lionimmunity tesl$.recoveredbyfEe61000-~·1" The test method documented in this part of IEC 61000 describes a consistent method to assess the immunity of equipment or asystem agamst a defined phenomenon As desCribedIn IEC Guide 107, this ISa baste EMC publlcatton for use by product committees of the IEC As also stated 10 GUide 107,the IEC product committees are responsible for determining whether this immunity test standard should be applied or not, and, If applied, they are responSible for defining the appropriate test levels Technical committee 77 and Its sub-committees are prepared to co-operate With product committees In the evaluation of the value of particular Immunitytests for their products. 2 Normative refe~nces The following referenced documents are indispensable for the application of thiSdocument For dated references, only the edition Cited applies For undated references the latest edition of the referenced document (inCluding any amendments)applies IEC 61000-2-8, ElectromagnetIc compallbillty (fMC) - Part 2·8 EnvlTonmenl . Voltal)e dIps and short Interruptions on public eiectnc power supply syslems WIth slatlstlcal measuremenl results 3 Terms :anddefinitions For the purpose of thrs document.the follOWing terms and definitions apply IS14700(Part4ISec 11) :2008 lEe61()()0.4..11 : 2004 3.1 basic EMC standard standard giving general and fundamental conditions or rules for the achievement of EMC. which are related or applicable to all products and systems and serve as reference documents for productcommittees NOTE Asdeterminedbythe AdvisoryCOmmitt..on Electromagnetic:Competibility(ACEC)- see IECGuide 107. 3.2 Immunity(to.disturbance) the ability of a device. equipment or system to perform without degradation in the presence of an electromagnetic disturbance [lEV 161-01-201 3.3 voltagedip a sudden reduction of the voltage at a particular point of an electricity supply system below a specifieddip threshold followed byits recovery after abriefinterval NOTE1 Typically. a dip is associated with the occurrence and termination 01 a short CirCUItor other extreme currentincreaseonthesystemorinstallatiensconnectedto it. NOTE2 A voltage dipis atwo-dimensionalelectromagneticdisturbance.the level 01which is determined by both voltage andtime(duration). 3.4 short interruption a sudden reduction of the voltage on all phases at a particular point of an electric supply system below aspecified mterrupnon threshold followed by Its restoration after abrief interval NOTE Sho0rt' Interruptions are typically assoc,ated with sWitchgear operauons related to the occurrence and te"",nahon shortCirCUitsonthe systemoroninstallationsconnectedto It 3.5 residual voltage(ofvoltage dip) the minimum value of r.ms voltage recorded during avoltage dip or shortinterruption NOTE The residual voltage may be expressed as avalue in volts or as apercentageor per unitvalue relative to the referencevoltage 3.e matfunctlon the termination of the ability of equipment to carry out Intended functions or the execution of unintendedfunctions bythe equipment 3.7 calibration methodto prove thatthe measurement equipment ISIn compliance with ItSspecifications NOTE Fo, the purposes01thisstandard.callblatlonisapplied to the testgenerator. 3.8 veriflc.tion set of operatrona which is used to check the test equipment system (e.g. the test generator and the interconnectmg cables) to demonstrate that the test system ISfunctioning within the' speclficabons given in Clause6 NOTE1 The methods.nedlorverif"lCationmay bedifferentlromthoseusedlor calibration. NOTE 2 The verification procedure 016.1.2 IS meant as a guide to insure the correct operation 01Ihe test generator,and otheritemsmakingupthe test set-up thatthe intendedwavelormisdeliveredtothe EUT. 2 IS 14700(Part4ISec 11): 2008 lEe61()()()-4..11 : 2004 4 General Electrical and electronic equipment may be affected by voltage dips, short interruption. or voltage variations of powersupply. Voltage dips and shortinterruptions are caused byfaults in the network. primarily.hortCIrcuits (see also lEe 61000-2-8), in installations or by sudden large changes of load. In certain c..... two or more consecutive dips or interruptions may occur. Voltage vari.tions .re caused by continuouslyvarying loads connected tothe network. These phenomena are random in nature and can be minimally characterizedfor the purpo.e of laboratorysimulation in terms of the deviationfrom the rated voltage and duration. Consequently, different types of tests are specified in this standard to simul.te the effects of abrupt voltage change. These tests are to be used only for p.rticular and ju.tified c..... under the responsibility of product specification or productcommittees. It is the responsibility of the product committees to establish which phenomena .mong the ones considered in this standard are relevant and to decide on the applicability of the teat. 6 Test levels The voltages in this standard use the rated voltage for the equipment (UTI •• a ba... for voltage test level specification. Where the equipmenthas a rated voltage range the follOWingshall apply: - if the voltage range does not exceed 20 % of the lower Voltage .pecified for the r.ted voltage range, a single voltage within that range m.y be spellCified ... basis for t..t level specification(UT); - in all other cases, the test procedure sh.1l be applied for both the lowesl .nd highest vollages declaredin the volt.ge range; - guidance for Ihe selection of lesllevels and duration.i. gIven in IEC 61000-2-8 5.1 Voltagedips and short Interruptions The change between UTand the changed voltage IS abrupt The step can start and stop atany phase angle on the mains voltage The following tesl voltage levels (In 0;"UTIare used 0%. 40%, 70 Ok and 80 %, corresponding 10 dips WIth residual voltages of 0Ok. 40·.4. 70% and 80% For voltage dips, the preferred test levels and durations are given in Table 1,and an example isshown in FIgure 1a) and FIgure 1b) For short mterruptrons. the preferred test levels and durations are given In Table 2. and an example is shown InFIgure 2 The preferred test levels and durations given In Tables 1 and 2 take into account the Information given In IEC 61000-2-8. The preferredtest levels in Table 1are reasonably severe, and are representative of many real world dips, but are not inlended10guarantee immunityto all voltage dips. More severedips, for example 0 % for 1 s and balanced three-phase diPS. may be considered by product committees. 3 IS14700(Part4ISec 11) :2008 lEe 61000-4-11 : 2004 The voltage rise time, 'r, and voltage fall time, If. during abrupt changes are indicated In Table 4. The levels and durations shall be given in the product specification. A test level of 0 % corresponds to a total supply voltage interruption. In practice, a test voltage level from 0% to 20 % of the ratedvoltage may be considered as atotal interruption Shorter durations In the table, in particular the half-cycle, should be tested to be sure that the equipment under test (EUT) operates within the performance limits specified for it When setting performance Criteria for disturbances of 0,5 period duration for products with a mains transformer, product committees should pay particular attention to effects which may result from Inrush currents For such products. these may reach 10 to 40 times the rated current because of magneticflux saturation of the transformer core after thevoltage dip Table 1- Preferred test level and durations for voltagedips Class' Testlevelanddurationsforvoltagedips(t.)(50 Hzl50 Hz) Class 1 Case-by·caseaccordingto the equipmentrequirements Class 2 o'll.during O'lf. during 70'If.during 25/30' cycles :A;cycle 1cycle ClassJ o'll.during O'll. dUring 40%dunng 70%during 80%dUring :A;cycle 1cycle 10112' cycles 251JO' cycles 250/300' cycles ClassXb X X X X X • Classesasper IEC61000-2-4.see Anne.B. b To be defined by product committee. For equipment connected directly or indIrectly to 'he public network,the lavelsmuslnolbelesssavereIhanClass2. e '25130cycles'maans'25cyclesfir50 Hzlest"and "30 cycles for 60 Hztest" Table2- Preferred test level and durations for short interruptions Clas.- Tutlevelandduration.for shortinterruptions(t.)(60 Hz/SOHz) Class , Case-by-caseaccordingto the aqutpmentrequirements Cless2 o'll.dUring 250/300' cycles ClassJ o'll.during 250/300' cycles Cless Xb X • CIas...as per IEC 610Q0..2-4,SeaAnne.B b To be definedby product committee For equIpment connecled directly or indirectly10 the public network,the levelsmuslnot belessseverethanClass2. , '2~JOOcycles'"'aans'250cyclesfor 50Hzlest'and '300cyclasfor 60 Hzlesl' 4 IS14700 (Part4ISec 11):2008 iec 61000-4-11 :2004 5.2 Voltage variations (optional) This test considers adefinedtransition between rated voltage UTand the changed voltage. NOTE Thevolt.gech.ng.likes pl.c.ov.rI shortperiod.•ndm.yoccurduetochlngeofIo.d. The preferred duration of the voltage changes and the time for which the reduced voltages are to be maintained are given in Table 3. The rate of change should be constant; however, the voltage may be stepped. The steps should be positioned at zero crossings, and should be no larger than 10% of UT. Steps under 1% of UTare considered as constant rates of change of voltage. Table3- Timing ofshort-term supplyvoltagevariations I Voltagetesllevel Tim.for decreesing Time.treduced Tim.for Incr•••lng voltageI'd) voltlge{t.) yoltlg.I'i)110HuHHz) i 70'llo Abrupl 1cycle 25130"cycles ! X· X· X· X· i' Tobe definedbyproductcommrt1ee i' "25130cycles"means"25cycleslor 50Hzlesr.nd·3Ocyclesfor80 Hzlear Thrs shape IS the typicalshape of amotorstartmq Figure 3 shows the rm s voltage as afunction of time Other values may be taken InJustified cases and shall be specified by the product committee t: I (perioda) NOTE The voltaged.cr••Hsto 70'llofor 25periods.Sl.p.1urocrosllng Figure1a)- Voltagedip- 70% voltage dip sine wave graph