UNCLASSIFIED Defense Technical Information Center Compilation Part Notice ADPO 11860 TITLE: Design and Implementation of a New Two-Way Opto-Electronic Probe for Optical Information Processing Components Analysis DISTRIBUTION: Approved for public release, distribution unlimited This paper is part of the following report: TITLE: Optical Storage and Optical Information Held in Taipei, Taiwan on 26-27 July 2000 To order the complete compilation report, use: ADA399082 The component part is provided here to allow users access to individually authored sections f proceedings, annals, symposia, etc. However, the component should be considered within [he context of the overall compilation report and not as a stand-alone technical report. The following component part numbers comprise the compilation report: ADP011833 thru ADP011864 UNCLASSIFIED Design and Implementation of A New Two-Way Opto-Electronic Probe for Optical Information Processing Components Analysis Shyh-Lin Tsao* and Thi-Chi Liou Department of Electrical Engineering Yuan Ze University Chung-Li, Taiwan, R.O.C ABSTRACT In this paper, a new two-way measurement method of optical signal processing elements is presented. The proposed method can decrease testing time and reduce human errors induced by disconnection in conventional one-way testing method. We can measure the scattering parameters of optical devices with fast two-way measurement when applying the new probes in conventional network analyzers. We demonstrated using our designed opto-electronic probes can measure the frequency responses of S21 and S12 of optical information processing component simultaneously. No reverse connections are needed for transfer functions measurement. In the future, this system can be applied to measure the characteristics of broadband optical signal processing elements for system applications. The theoretical model we built is very match to the experimental results. Key words: Opto-electronic Probe , Optical signal processing , Measurement, Fiber optics, Optical filter 1. INTRODUCTION High speed optical signal transmission above Gbps in fiber communications show promising results recently1 . Using lightwave technology for measuring S parameters of optical signal processing components has becoming an important issue. The application of a microwave network analyzer tailored an opto-electronic probe for analyzing fiber-optic signal processing components has been reported 9. But, the human errors induced by disconnections are introduced with using full two ports S parameter measurement with changing direction of element. The purpose of "through" calibration is to correct errors in transmission coefficients in both the forward and reverse direction for the measurement of device with many ports 10.B ut no equipment can achieve a two-way "through" calibration for optical signal processing elements until now. The use of lightwave technology for measuring S parameters of optical component is becoming important. Development of an optical component 100Gbps laser diode were reported recently". The microwave photonic component characteristics measurement is obviously urgent now. Some calibrations of prototype true time delay optical signal processing applications, such as optical beam-forming circuit networks, array antennas and matched filters applications, are reported 12 Correspondence: E-mail:[email protected], Telephone: 886-3-4638800-424, Fax: 886-3-4639355 242 In Optical Storage and Optical Information Processing,H an-Ping D. Shieh, Tom D. Milster, Editors, Proceedings of SPIE Vol. 4081 (2000) o 0277-786X/00/$15.00 In this paper, we propose and demonstrate a new probe for applying in optical component network analyzer. A two-way fast measurement can be achieved by using the new method to reduce testing time and human errors. 2.SYSTEM STRUCTURE AND RESULTS 2.1 Description of the system The schematic diagram of the new method of testing two-port optical signal elements is shown in Fig. 1. We designed a new two-way optoelectronic probe including an electrical circulator, an optical circulator, an optical transmitter and an optical receiver as the dashline block shown in Fig. .The device under test (DUT) is inserted in the middle of the two probes. We use two designed probes to set up the optical component S parameters measurement testbed. In this paper, we use a fiber ring as a DUT. The parameters of the DUT are G (coupling coefficient) = 0.9 , L(length) =154 cm and p (intrinsic loss of coupler)= 0.85, as shown in Fig.2. When the system function of the network analyzer operates at the S21 mode and S12 mode, the network analyzer can output electronic frequency sweeping signal to the optical transmitter, then through the optical circulator to the DUT. After the signal go through the DUT, the optical signal received by the second probe. The optical signal will be converted to the electrical signal by the optical receiver. Because of the electrical circulators and optical circulators in these two probes can provide two-way signal bypassing function, the measurement system we setup can provide a two-way fast S-parameter measurement. In the following section, we use this system to measure a single fiber resonator notch filter. 2.2 Theory and Experimental Results The theorretical model of a single fiber ring resonator notch filter used as the DUT shown in Fig.2 is derived in this subsection. The signal flow chart of the DUT is shown in Fig.3. We define the transfer function of the first path as H (z) 1 and the second path as H (z). 2 Output OF (z) of the feedback path can be written as OF(Z) = HF(z)1F= --LZL G- I -1p (1) I where G is the coupling coefficient, p is the intrinsic loss of coupler, L is the loop transmittance of the fiber loop line. The output Ol of the first path can be described as 0 (Z) = H, (z)I = GpI (2) 1 The output 02 (z) at the second path output is 0 (Z)= H (z)I =(1-Gp )2H (Z)I2 = (1-Gp) 2LZ-112 (3 2 2 2 1- LGZ- p Combining the above three equations, we find the transfer function can be represented as 243 0 (1 - Gp)LZ _ H(Z) = Gp + (4) I 1 - LGZ-'p From the above derived theoretical model of the DUT, we simulate the frequency responses of S and S .The simulation 21 12 results of S and S12 are shown in Fig.4 and Fig.5, respectively. The measured results are shown in Fig.6 and Fig.7, 21 respectively. Using the experimental setup shown in Fig.1, we can measure the frequency responses of S and S12. 21 Comparing the numerical and experimental results, we find these two results have good coincidence. This results shows our designed two-way opto-electric probe is very helpful for measuring the optical fiber information components. 3. CONCLUSION In this paper, we made and design a new two-way optoelectronic probe for application in S parameters measurement of optical information processing components. Measuring a fiber ring notch filter as a DUT, we find the numerical results and the experimental results matched very well. Therefore, this two-way optoelectronic probe can be studied in the future for microwave-photonic information processing devices measurement. ACKNOWLEDGMENT This work was supported in part by National Science Council of Republic of China under contract no. NSC 89-2215-E- 155-002. REFERENCE 1. H. Izadpanch, D. Chen, C.Lin, M. A. Saifi, . 1. Way, A. Yiyan, J. L. 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Microwave Photonics, International Topical Meeting ,pp.55-58,1998. 6. H. Taga , S. Yamamoto , N. Edagawa , Y. Yoshida , S. Akiba , H. Wakabayashi," Fiber chromatic dispersion equalization at the receiving terminal of IM-dd ultra-long distance optical communication systems", Lightwave 244 Technology, vol.26,no.5,pp. 1042-1046,1994. 7. V. Pruneri, F.Samoggia, G. Bonfrate, H.Takebe, P.G.Kazansky, "Poled glass optical communication devices", Integrated Optics and Optical Fibre Communications, 11t h International Conference, Vol.2, pp. 103-106,1997.. 8. F.S.Yang , M.E. Marhic, X.Y. Zou, L.G. Kazovsky,"Cancellation of SRS cross talk in an analog WDM optical communication system by a parallel technique", Technical Digest ,pp.86-87,1998. 9. David Curtls and Elizabeth E.Ames, "Characterization of high speed optical components", IEEE Transaction Microwave Theory and Techniques,vol.38,no.5,pp.552-559,1990.. 10. Balasundaram Elamaran,Roger D. Pollard, Stavros lezekiel," Tax calibration of optcial scattering parameter test set". 11. Takada, A., and Sarawatari, M.,"100 Gbps optical signal peneration by time-division multiplication of modulated and compressed pulses from gain-switched DFB laser diode", Electron. Lett.,Vol.24,No.23,pp. 1406-1408,1998. 12. Atsushi Ishihara, "Method for calibrating circuit network measurement devices", United States Patent number 5,646,536,1997. 245 S~Network C Analyzer Tx Aewprbeo tR A new probe of two-way optical component A new probe of two-way optical component network analyzer network analyzer Coaxial cable Microwave circulator 4 cb Optical circulator Fig. 1 Experimental setup Tx : Optical transmitter Rx: Optical receiver G Fiber Loop P L Fig.2 Schematic diagram of an SFRRF 246 10 0, + S1G- p H, (z) H2 (Z) ] 1-G p I0,tzlOF L Z- (cid:127) + HF (z) G p Fig.3 The singal flow chart of the fiber ring resonator notch filter as a DUT S21 i .. -1 i I II !N i 5 dB/div , .. I I I I i i I I - - - - -L --- ------- - --- I------- I66 I 8 MIz I I II SI I i i I I I I I IiIi i i I I I I i I 660 MHz 850 MHz Frequency Fig.4 Simulated frequency response of S21 of the DUT 247 S12 ,-..- -.-. -..- . . . . . . . ... .. . " x I. . .I I. 1/ II 1 I IF I I i 5dB/dib - ---- - -------- I I i I I I I I I I I I I I I I I I I I I I i 5d....b---- t I I I I I I i .... I-------4---. ---- 4-- - . - - -...---- I I i I I I i I i I I i i I I --=I . . I _ _ _ _.I I I . Ig .I . . . - I I iII I I I I I I I I I I I I i I I I I I 660 MHz 850 MHz Frequency Fig.5 Simulated frequency response of SI, of the DUT S21 660 MHz 850 MHz Frequency Fig.6 Measured frequency response of S,(cid:127) of the DUT 248 S12 4A 5 dB/div 4, 600 MHz 850 MHz Frequency Fig.7 Measured frequency response Of S of the DUT 12 249