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cross-section transmission electron microscopy of the ion implantation damage in annealed diamond PDF

144 Pages·2013·1.65 MB·English
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Preview cross-section transmission electron microscopy of the ion implantation damage in annealed diamond

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Single energy implantation of carbon ions in synthetic HPHT (type Ib), at Research Foundation-Centre of Excellence in Strong Materials at Wits
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Most books are stored in the elastic cloud where traffic is expensive. For this reason, we have a limit on daily download.