EXRS2012,  June  18  -­‐  22,  Vienna,  Austria     European  Conference  on  X-­‐ray   Spectrometry     Organized  by:     Atominstitut,  Vienna  University  of  Technology,  Vienna,  Austria       hosted  by:     International  Atomic  Energy  Agency,  Vienna,  Austria     under  the  patronage  of     the  Austrian  Federal  Ministry  for  Science  and  Research,  Vienna,  Austria                 Program,  General  Information   and  Book  of  Abstracts Impressum   Offenlegung  gemäß  §  25  Mediengesetz:   Atominstitut,  Vienna  University  of  Technology   1020  Wien   Radiation  Physics  Department   Ao.  Univ.-­‐Prof.  DI  Dr.  Christina  Streli   Nutzungsrechte   Copyright  ©  by   Technische  Universität  Wien   Atominstitut   Stadionallee  2   A-­‐1020  Wien   Tel.:  +43  1  58801  141330     Druck:  www.grafischeszentrum.com Welcome   The  Local  Organizing  Committee  of  the  15  th  European  Conference  on  X-­‐ray   Spectrometry    2012  is  pleased  to  welcome  all  participants  of  this  conference.  About   300  participants  from  61  countries  will  share  opportunity  to  exchange  ideas  and   knowledge  related  to  X-­‐ray  Spectrometry  ,  including  fundamental  aspects,   technological  developments,  traditional  and  novel  areas  of  applications  and   interdisciplinary  research.     We  are  grateful  to  our  sponsors  and  all  people  that  helped  us  during  the   organization  of  this  event.  We  hope  you  will  enjoy  the  conference  in  a    stimulating   and  friendly  atmosphere  .     Christina  Streli  and  Andrzej  Markowicz   Chair    and  co-­‐chair  of  the  local  organizing  committee     Local  Organizing  committee   • Christina  Streli  -­‐  ATI,  TU  Wien  -­‐  Chair   • Andrzej  Markowicz  -­‐  IAEA  -­‐  Co-­‐chair   • Martina  Griesser  -­‐  KHM,  Vienna   • Andreas  Karydas  -­‐  IAEA   • Michael  Mantler  -­‐  Vienna   • János  Osán  -­‐  KFKI-­‐AEKI,  Budapest,  Hungary   • Roman  Padilla-­‐Alvarez  -­‐  IAEA   • Giancarlo  Pepponi  -­‐  FBK,  Trento,  Italy   • Manfred  Schreiner  -­‐  Academy  of  Fine  Arts,  Vienna   • Peter  Wobrauschek  -­‐  ATI,  TU  Wien     International  Advisory  Board   • Burkhard  Beckhoff,  Germany   • Maria  Luisa  Carvalho,  Portugal   • Roberto  Cesareo,  Italy   • Stjepko  Fazinić,  Croatia   • Jorge  E.  Fernandez,  Italy   • René  Van  Grieken,  Belgium   • Yohichi  Gohshi,  Japan   • Marie-­‐Christine  Lepy,  France   • Jorge  Sanchez,  Argentina   • Szabina  Török,  Hungary   • Peter  Wobrauschek,  Austria     Conference  secretary:   EXRS-­‐2012  Secretariat   Atominstitut  TU  Wien   Stadionallee  2   1020  Wien,  Austria   e-­‐mail:  [email protected] Scientific  program   The  European  Conference  on  X-­‐Ray  Spectrometry  (EXRS)  is  a  biennial  conference   series  which  started  in  Copenhagen  and  Göteborg  (1984,  1986)  and  continued  in   Vienna,  Antwerp,  Myconos,  Budapest,  Lisbon,  Bologna,  Krakow,  Berlin,  Alghero,   Paris,  Dubrovnik    and  Figueira  da  Foz.     The  15th  EXRS  conference  is  devoted  to  the  exchange  of  information  and  experience   on  the  emerging  and  innovative  techniques  in  the  field  of  X-­‐ray  spectrometry  and   related  areas.  The  conference  will  provide  a  framework  in  which  scientists  of  various   research  areas  will  be  able  to  convene  and  discuss  X-­‐ray  techniques  and  their   successful  applications.  A  rich  scientific  and  social  program  will  allow  experienced   experts,  young  scientists,  and  industrial  exhibitors  to  exchange  views  and  start  new   collaborative  projects.  Contributions  are  devided  into  22  invited  lectures,  93  oral   presentations  and  210  poster  presentations.     Conference  Sessions:   1     Art  &  Cultural  Heritage   2   Interactions  of  X-­‐rays  with  matter  and  fundamental  parameters   3     PIXE  &  electron  induced  XRS   4     Microbeam  /  Nanobeam     5     TXRF,  GIXRF  and  related  techniques   6     X-­‐ray  imaging  and  tomography   7     Mobile  and  portable  XRF   8     Synchrotron  XRS,  XAFS,  RIXS  and  XES   9     Recent    developments  by  XRS    manufactures   10     High  resolution  X-­‐ray  absorption  and  emission  spectroscopy   11   Advanced  materials  and  nanoscience     12     XRS  Metrology,  QC/QA   13     XRS  -­‐  Instrumentation  (X-­‐ray  sources,  optics  and  detectors)   14     Quantification  methodology   15     Sample  preparation  and  sampling  strategies   16     Industrial  quality  and  process  control   17     Earth  and  environment  sciences   18     Education  and  data  interpretation   19     Life  sciences  and  forencis Conference  Sponsors:                         Social Program Sunday 15:00- 19:00 Opening mixer (Arcotel-Kaiserwasser) collection of ground passes and conference registration at IAEA Gate 1 Wednesday 14:00- Conference excursion (Klosterneuburg 18:00 /Kahlenberg) 18:00 - Guided tour Academy of Fine Arts 20:00 Painting Gallery (free of charge) Thursday 20:00 Heuriger Fuhrgasslhuber partially sponsored by the Lord Major of Vienna Invited  Speaker:     Joy  Andrews   Nanoscale  chemical  imaging  of  energy  materials  with  full-­‐field     transmission  X-­‐ray  microscopy   Samuel  Bamford   Challenges  and  Status  in  the  Development  of  ICT-­‐Based  Learning  and     Training  Modules  on  Nuclear  Instrumentation  and  Spectrometry   Artur  Braun   Application  of  x-­‐ray  and  electron  spectroscopy  to  energy  materials   Björn  De  Samber   Synchrotron  Radiation  based  Micro-­‐  and  Nanoanalysis  applied  to     Biological  Systems   Shinjiro  Hayakawa   Depth  selective  XAFS  characterization  using  simultaneous  detection  of     x-­‐ray  fluorescence  and  conversion  electrons   Joanna  Hoszowska   High-­‐resolution  x-­‐ray  emission  spectroscopy  for  fundamental     parameters  determination   Yuying  Huang   Synchrotron  radiation  X-­‐ray  micro/nanobeam  XRF  and  XANES     techniques:  application  in  life  science   Nikolaos  Kallithrakas-­‐Kontos   Selective  membranes  in  X-­‐Ray  Analysis:  A  preconcentration     step  or  a  sensor?   Ioanna  Mantouvalou   Laser-­‐produced  plasma  sources  for  applied  spectroscopy  in  the  soft     X-­‐ray  region   Eva  Margui   Total  reflection  X-­‐ray  fluorescence  spectrometry  in  the  environmental     field:  A  review  of  some  recent  investigations  and  applications   Florian  Meirer   Application  of  grazing  incidence  x-­‐ray  spectroscopy  to  the  analysis  of     Arsenic  doped  Silicon  produced  by  plasma  immersion  ion  implantation   Beatrix  Pollakowski  Species  depth  profiling  of  deeply  buried  nanostructures   Phil  Potts   Provenance,  Process  and  Propriety  -­‐  Portable  XRF  in  cultural  heritage   Martin  Radtke     The  colour  X-­‐ray  camera:  basics,  applications  and  perspectives.     Miguel  Reis   PIXE  in  the  slow  collisions  regime   Stefano  Ridolfi   EDXRF  portable  systems  for  Analysis  of  Works  of  Art   Volker  Rössiger   Standard  Reference  Material  and  Standardless  XRFA   Rafal  Sitko   Influence  coefficient  algorithms  in  X-­‐ray  fluorescence  analysis  of  thick     and  intermediate-­‐thickness  samples   Andrea  Somogyi   Scanning  hard  X-­‐ray  nanobeam  techniques  at  the  Nanoscopium     beamline  of  Synchrotron  Soleil   João  Veloso   EDXRF  Imaging  with  2D  detectors   Charalambos  Zarkadas  Quality  improvements  of  EDXRF  instruments  with  close  coupled     geometries  by  means  of  Monte  Carlo  simulations   Janina  Zieba-­‐Palus   Examination  of  forensic  traces  by  the  use  of  X-­‐ray  spectrometry Instructions  for  conference  proceedings   The  conference  proceedings  will  be  available  for  downloading  by  the  participants  after  the   conference.  The  conference  proceedings  will  contain  the  submitted  manuscripts  in  pdf   format.  Contributions  transmitted  to  the  Conference  Secretariat  before  July  1st,  2012  will  be   automatically   included,   without   any   reviewing   procedure.   Here   there   are   no   specific   instructions  about  size  and  shape:  the  manuscript  will  be  included  such  as  the  authors  will   have  prepared  it,  under  their  own  responsibility.   Authors  of  accepted  contributions  are  invited  to  submit  one  manuscript  for  publication  in  a   special  issue  of  X-­‐Ray  Spectrometry  (Wiley  Interscience).  Manuscripts  should  be  prepared  in   a  strict  format  of  the  XRS  and  will  be  reviewed  by  the  program  committee  of  the  conference.   Manuscripts  have  to  be  submitted  to  the  conference  secretary  before  June  15th.  Authors   Instructions  according  to  the  rules  of  XRS.     http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)10974539/homepage/ForAuthors.html.         Industrial    exhibition:     Traditionally  EXRS  conferences  include  an  Industrial  Exhibition  featuring  companies   producing  X-­‐ray  related  instruments.   The  Industrial  Exhibition  stands  will  be  located  in  the  Rotunda,  where  also  the  coffee   in  the  coffee  breaks  is  served.  It  will  take  place  during  the  whole  conference.     Industrial  exhibitors  and  sponsors:     http://www.amptek.com/   http://www.bruker-­‐   axs.com/x_ray_spectrometry.html     http://www.e2v.com/ http://www.elvatech.com/en/     http://www.excillum.com/     http://www.helmut-­‐fischer.de     http://www.ifg-­‐adlershof.de/     http://www.i-­‐tech.si/     http://www.ketek.net/     http://www.moxtek.com/ MOXTEK®     http://www.pndetector.de/     http://www.pnsensor.de/     http://www.rigaku.com/   http://www.siintusa.com/             http://www.edax.com/ http://www.spectro.com http://www.thermoscientific.com     http://www.toivel.com/         http://www.xglab.it/     http://www.xia.com/   http://www.xos.com Conference  site: